Topics for
TekSummit R & D for Test & Measurements,
Hosted by GAO Research Inc.

Session 1: Frontiers in Quantum Metrology and Fundamental Constants

  • Redefinition and realization of SI base units
  • Quantum Hall resistance and Josephson voltage standards
  • Optical lattice clocks and time-frequency transfer
  • Quantum interferometry and entanglement-based measurements
  • Single-electron and photon-counting instrumentation
  • Fundamental constants: precision determination and stability

Session 2: Ultra-Precision and Nanometrology Techniques

  • Scanning probe microscopy for dimensional metrology
  • Sub-nanometer displacement and position sensing
  • Atomic-scale surface roughness measurements
  • Interferometric and capacitive position metrology
  • Nanoparticle characterization and size distribution
  • Traceable measurements at the nanoscale

Session 3: High-Frequency, mmWave, and THz Measurements

  • Calibration and characterization of mmWave and THz systems
  • Nonlinear and active device modeling and measurement
  • Dielectric characterization at mmWave and THz frequencies
  • 5G/6G and high-bandwidth spectrum analysis
  • Radiometry and THz imaging systems
  • On-wafer and OTA measurement challenges

Session 4: Optical and Photonic Metrology

  • Ultra-stable lasers and frequency comb calibration
  • Free-space and fiber-optic interferometry
  • Photonic integrated circuit test platforms
  • Characterization of light sources and detectors
  • Spectroradiometric and colorimetric measurements
  • Coherence, polarization, and scattering analysis

Session 5: RF and Microwave Metrology

  • Vector network analyzer (VNA) traceability and error models
  • Noise figure and phase noise measurement techniques
  • Power sensors and standards at microwave frequencies
  • Calibration artifacts and load-pull measurements
  • Cross-spectrum and correlation-based techniques
  • Passive and active microwave component characterization

Session 6: Electrical and Electronic Metrology

  • Current, voltage, and resistance calibration techniques
  • Digital multimeter verification and standard resistors
  • Electromagnetic interference and compatibility metrics
  • High-impedance and low-leakage measurement systems
  • Switching artifacts and parasitic suppression in electronics
  • Verification of electronic reference instruments

Session 7: Mechanical Metrology and Structural Testing

  • Dimensional metrology with coordinate measuring machines (CMMs)
  • Angular and linear displacement calibration
  • Surface texture and form deviation evaluation
  • Vibration, modal, and impact response testing
  • Residual stress and mechanical fatigue metrology
  • Robotic-assisted mechanical testing systems

Session 8: Thermal and Thermophysical Measurements

  • Precision thermometry and fixed-point calibration
  • Thermal conductivity and diffusivity testing
  • Temperature mapping in micro/nano devices
  • Cryogenic temperature metrology
  • Heat flux and thermal imaging techniques
  • Blackbody and radiation thermometry development

Session 9: Chemical and Gas Metrology

  • Mass spectrometry and isotope ratio validation
  • Gas standards and primary mixture generation
  • Infrared and Raman spectroscopy for trace gas detection
  • VOC and greenhouse gas metrology
  • Calibration of chemical sensors and analyzers
  • Reference materials and chemical uncertainty analysis

Session 10: Metrology for Smart Manufacturing and Industry 4.0

  • Real-time process control with in-situ metrology
  • Sensor fusion and AI-assisted decision making
  • Closed-loop feedback systems for manufacturing metrology
  • Digital twins and virtual instrumentation platforms
  • Robotic vision-based metrology for additive manufacturing
  • Standards for interoperable metrology in smart factories

Session 11: AI, Data Science, and Uncertainty in Metrology

  • Bayesian and machine learning approaches for uncertainty quantification
  • AI-enhanced test optimization and fault detection
  • Neural networks for signal denoising and prediction
  • Metrological traceability of AI-driven measurement systems
  • Handling of outliers and anomalous data
  • Standards and documentation of data integrity

Session 12: Time, Frequency, and Synchronization Metrology

  • GNSS-based time transfer and integrity testing
  • Ultra-low-jitter clock distribution systems
  • Two-way satellite time and frequency transfer (TWSTFT)
  • Frequency stability metrics (Allan, Hadamard deviations)
  • UTC realization and national timekeeping
  • Time synchronization over networks (PTP, NTP, White Rabbit)

Session 13: Environmental and Climate Measurement Systems

  • Air quality and particulate monitoring standards
  • Climate variable instrumentation: temperature, pressure, humidity
  • Calibration of weather and hydrological sensors
  • Metrology for oceanographic and atmospheric parameters
  • Remote sensing validation (LIDAR, satellite)
  • Traceable CO₂ and methane detection systems

Session 14: Biomedical and Life Science Measurement Innovations

  • Quantitative bio-imaging and fluorescence calibration
  • Biophysical property measurement of tissues and cells
  • Physiological monitoring system accuracy (ECG, SpO₂, BP)
  • Calibration of diagnostic and therapeutic devices
  • Biosensor calibration and stability
  • Measurement standards in genomic and proteomic analysis

Session 15: Materials Characterization and Non-Destructive Testing

  • Microstructure quantification and image analysis
  • Spectroscopic techniques for material identification
  • Fatigue, creep, and fracture mechanics testing
  • Non-destructive testing (ultrasound, X-ray, eddy current)
  • Phase transformation and residual stress monitoring
  • Nano-indentation and tribology for thin films

Session 16: Electromagnetic Compatibility (EMC) and High-Voltage Testing

  • Radiated and conducted emissions testing
  • Shielding effectiveness and field strength measurements
  • Lightning impulse and high-voltage dielectric tests
  • Electric/magnetic field immunity testing
  • High-voltage test equipment and calibration
  • EMC modeling and compliance with CISPR/IEC standards

Session 17: Calibration Science, Infrastructure, and Global Comparisons

  • Development of national and international primary standards
  • Automation in calibration laboratories
  • Remote and robotic calibration methods
  • Measurement intercomparisons and key comparisons (CIPM-MRA)
  • Laboratory accreditation and quality systems (ISO/IEC 17025)
  • Emerging traceability chains for novel quantities

Session 18: Legal, Ethical, and Societal Aspects of Metrology

  • Measurement and traceability in legal metrology
  • Standards harmonization and regulation impact
  • Ethical frameworks for data and measurement reliability
  • Socio-economic impact assessments of metrology R&D
  • Measurement education and workforce development
  • Role of metrology in public safety and policymaking
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