Topics for
TekSummit - R & D for AI, Advanced Test & Measurement,
Hosted by GAO Research Inc.
Introduction
Advancements in AI and precision instrumentation are redefining the landscape of test and measurement. From quantum calibration to terahertz signal integrity, these technologies ensure compliance, elevate performance, and foster innovation in industries demanding the highest accuracy—spanning aerospace, photonics, semiconductors, and national metrology systems.
1. Frontiers in Quantum Metrology and Fundamental Constants
This session examines how quantum effects and precision measurement of fundamental physical constants are transforming global standards. Attendees will gain insight into how quantum metrology underpins next-generation calibration frameworks and measurement traceability across national and industrial labs.
Key Subtopics
- Quantum electrical metrology (Josephson junctions, quantum Hall effect)
- Redefinition of SI units using Planck constant, Boltzmann constant
- Atom interferometry and optical lattice clocks
- Single-electron transport and quantum current standards
- Quantum voltage and resistance references
- Quantum-enhanced uncertainty analysis
- Fundamental physical constants in material science and precision engineering
- Standardization frameworks (BIPM, NIST, NMIs)
Applications
- National metrology laboratories and international standardization
- Semiconductor process calibration
- High-precision aerospace instrumentation
- Time and frequency distribution networks
Tools & Techniques
- Quantum voltmeters and resistance bridges
- Cryogenic current comparators
- Optical lattice and ion clocks
- Frequency combs and atomic beam systems
Challenges & Solutions
- Challenge: Achieving measurement traceability at the quantum scale
Solution: Adopt quantum-referenced devices traceable to SI units - Challenge: Complex calibration of quantum systems
Solution: Use AI for real-time quantum error correction and predictive stability - Challenge: Limited access to national quantum standards
Solution: Collaborate through interlaboratory comparisons and shared calibration services
Learning Objectives
- Understand quantum-based definitions of SI units
- Evaluate how fundamental constants support modern calibration
- Explore instrumentation aligned with quantum standards
- Apply quantum metrology to industrial and laboratory-scale measurements
2. Ultra-Precision and Nanometrology Techniques
Focused on ultra-fine dimensional and surface measurements, this session details emerging techniques in nanometrology essential for semiconductor fabrication, advanced materials, and micro-electromechanical systems (MEMS). The session emphasizes instrumentation and AI-enhanced methodologies that push precision to the sub-nanometer level.
Key Subtopics
- Atomic force microscopy (AFM), scanning tunneling microscopy (STM)
- White light interferometry and scatterometry
- Laser interferometric displacement sensing
- Precision surface roughness and defect characterization
- Sub-nanometre calibration standards and uncertainty quantification
- AI-assisted defect detection and classification
- Thermal drift compensation and vibration isolation
- High-resolution coordinate metrology
Applications
- Semiconductor lithography and metrology
- MEMS/NEMS device fabrication
- Biomedical nano-devices
- Precision optics and lens testing
Tools & Techniques
- AFM, STM, SEM-based metrology systems
- Precision laser interferometers
- AI algorithms for image-based surface analysis
Challenges & Solutions
- Challenge: Surface variability under nanoscale imaging
Solution: Use environmental control and in-situ calibration methods - Challenge: Drift and vibration affecting nano measurements
Solution: Implement active damping and real-time compensation feedback - Challenge: High volume of surface defect data
Solution: Apply machine learning to automate feature classification
Learning Objectives
- Deploy nanometrology instruments with traceable accuracy
- Implement AI models for nanoscale defect analysis
- Control environmental factors impacting ultra-precision tests
- Build robust nano-characterization workflows for production and R&D
3. High-Frequency, mmWave, and THz Measurements
Key Subtopics
- Vector network analysis at mmWave/THz bands
- On-wafer probing and de-embedding at high frequencies
- Signal integrity in ultra-wideband circuits
- Time-domain reflectometry (TDR) for interconnect testing
- Calibration and verification of THz components
- Over-the-air (OTA) testing and phased array measurements
- Electromagnetic compatibility (EMC) in high-frequency systems
- AI-assisted waveform analysis and signal classification
Applications
- 5G/6G base station and handset development
- Automotive radar systems
- Satellite communication payload validation
- Secure military-grade THz communications
Tools & Techniques
- mmWave VNAs and real-time spectrum analysers
- THz time-domain spectroscopy systems
- High-speed oscilloscopes with deep memory
- OTA test chambers and planar near-field scanners
Challenges & Solutions
- Challenge: Calibration accuracy at mmWave and THz frequencies
Solution: Use automatic calibration modules and de-embedding algorithms - Challenge: RF signal loss and parasitics in test setups
Solution: Optimize interconnects and probe station integrity - Challenge: Analysing complex, wideband signal behaviour
Solution: Use AI for spectral feature extraction and anomaly detection
Learning Objectives
- Execute reliable high-frequency tests from GHz to THz
- Improve RF test accuracy with advanced calibration techniques
- Interpret mmWave signals using modern test instrumentation
- Integrate AI tools for real-time waveform and EMC analysis
4. Optical and Photonic Metrology
This session explores R&D in optical and photonic measurement systems, enabling ultra-accurate calibration and testing for Fiber optics, laser systems, photodetectors, and photonic integrated circuits. Precision optical testing is fundamental to advancing communications, sensing, and quantum information science.
Key Subtopics
- Optical power and wavelength calibration
- Interferometric optical testing and Fiber inspection
- Photonic chip characterization (modulators, detectors, splitters)
- Laser linewidth and phase noise measurement
- Spectral responsivity and irradiance testing
- High-speed optical T&M for coherent communication
- Optical time-domain reflectometry (OTDR)
- Quantum photonic measurements (entanglement, coherence)
Applications
- Optical telecom systems (DWDM, coherent optics)
- Photonic computing and signal processing
- Medical laser calibration
- Quantum sensing and cryptography platforms
Tools & Techniques
- Optical spectrum analyzers, tunable lasers
- High-speed photodiodes and sampling oscilloscopes
- Optical interferometers and autocorrelators
- AI-driven defect inspection systems for fiber and waveguides
Challenges & Solutions
- Challenge: Precise phase and polarization alignment in optics testing
Solution: Use polarization-maintaining setups and real-time feedback control - Challenge: Characterizing sub-picosecond timing in photonic circuits
Solution: Deploy ultra-fast sampling scopes and correlation techniques - Challenge: Testing complex integrated photonic structures
Solution: Combine simulation with AI-enhanced inverse design validation
Learning Objectives
- Apply modern optical metrology tools for photonic component validation
- Ensure wavelength and power traceability using calibrated systems
- Test high-speed, coherent optical systems under real-world conditions
- Integrate AI for defect detection in optical manufacturing and QA
5. RF and Microwave Metrology
Key Subtopics
- S-parameter measurement and calibration
- Power and impedance measurements at GHz frequencies
- Phase noise and frequency stability analysis
- On-wafer and coaxial VNA measurements
- Electromagnetic interference (EMI) and EMC testing
- High-power RF device testing
- Traceability to national RF standards (e.g., NIST)
- AI-based anomaly detection in RF spectrum
Applications
- 5G/6G communication hardware testing
- Aerospace radar and avionics certification
- RF component development for satellite systems
- Wireless medical device validation
Tools & Techniques
- Vector Network Analyzers (VNA)
- Spectrum analyzers with real-time capability
- RF power sensors and directional couplers
- Signal generators and synthesizers
- AI-driven signal pattern recognition tools
Challenges & Solutions
- Challenge: De-embedding complex test fixtures at high frequencies
Solution: Use multi-tier calibration and AI-aided correction algorithms - Challenge: Drift in signal generators or power sensors
Solution: Regular automated calibration against traceable standards - Challenge: Identifying intermittent RF interference
Solution: Deploy machine learning models on time-series spectrum data
Learning Objectives
- Understand best practices in RF calibration and traceability
- Apply AI techniques to enhance RF signal analysis
- Select appropriate test instrumentation for complex RF systems
- Design reproducible RF test setups for regulatory compliance
6. Electrical and Electronic Metrology
This session explores precise electrical measurement methods for voltage, current, resistance, and capacitance—critical for electronics R&D, power systems, and calibration services. It emphasizes accuracy, traceability, and AI-enhanced fault analysis in circuit evaluation and standards compliance.
Key Subtopics
- DC and AC voltage/current metrology
- Capacitance and inductance measurement
- Resistance standards and bridges
- Transient and harmonics analysis
- Circuit simulation and model-based testing
- AI-based diagnostics for PCB fault isolation
- Traceability in automated test equipment (ATE)
- Power quality testing and compliance
Applications
- Power electronics and battery management systems
- Consumer electronics production QA
- Calibration labs and traceability chains
- Smart grid and industrial power monitoring
Tools & Techniques
- Precision digital multimeters (DMMs)
- Electrical calibrators and source-measure units (SMUs)
- Bridge circuits (Wheatstone, Kelvin, etc.)
- Oscilloscopes and logic analyzers
- AI tools for circuit fault pattern recognition
Challenges & Solutions
- Challenge: Environmental factors affecting electrical measurements
Solution: Implement thermal stabilization and shielding systems - Challenge: Traceability gaps in ATE platforms
Solution: Integrate calibrated instruments and audit workflows - Challenge: Difficulty locating micro faults in high-density PCBs
Solution: Use AI-based PCB image diagnostics and signature analysis
Learning Objectives
- Gain proficiency in precision electrical measurements
- Understand traceability frameworks for electronic metrology
- Leverage AI for fault detection in complex circuits
- Build compliant test platforms for diverse electrical devices
7. Mechanical Metrology and Structural Testing
This session covers measurement techniques for force, mass, displacement, strain, and vibration. With mechanical integrity being a critical requirement in construction, transportation, and manufacturing, R&D in mechanical metrology ensures performance reliability, structural safety, and lifecycle prediction.
Key Subtopics
- Load, force, torque, and pressure measurement systems
- Strain gauges and extensometers
- Structural health monitoring (SHM) using sensor networks
- Modal analysis and dynamic response testing
- Fatigue testing of mechanical components
- AI-based vibration pattern recognition
- 3D scanning and coordinate metrology systems
- Standards for traceable mechanical calibration
Applications
- Aerospace and automotive structural testing
- Civil infrastructure health monitoring
- Heavy equipment and robotics
- Material testing and certification
Tools & Techniques
- Load cells and torque transducers
- Vibration sensors and accelerometers
- DAQs and real-time strain logging platforms
- Laser Doppler vibrometers and 3D CMMs
- AI-based SHM data interpretation platforms
Challenges & Solutions
- Challenge: Complex data fusion from multiple structural sensors
Solution: Use AI algorithms for sensor correlation and anomaly detection - Challenge: Signal noise in dynamic mechanical tests
Solution: Apply advanced filtering and adaptive averaging techniques - Challenge: Difficulty predicting fatigue failures in composites
Solution: Integrate AI-driven life modelling with SHM data
Learning Objectives
- Master modern structural and mechanical test instrumentation
- Apply AI to SHM data for predictive maintenance
- Perform standards-based calibration of mechanical sensors
- Improve dynamic testing for reliability engineering
8. Thermal and Thermophysical Measurements
Focused on the precise characterization of thermal behaviour, this session addresses the metrology of temperature, heat flow, thermal conductivity, and thermophysical properties across industrial and scientific applications. Thermal testing is crucial for electronics reliability, materials R&D, and energy efficiency.
Key Subtopics
- Contact and non-contact temperature measurement (IR, thermocouples)
- Thermal conductivity and diffusivity analysis
- Phase change detection and calorimetry
- Thermal expansion and strain
- Thermophysical modeling and material characterization
- AI-enhanced thermal imaging diagnostics
- Traceability in thermal metrology systems
- Calibration of temperature sensors and IR cameras
Applications
- Electronics cooling and thermal management
- Energy systems and battery thermal analysis
- Process industries (glass, metal, polymers)
- Aerospace and automotive thermal qualification
Tools & Techniques
- Differential scanning calorimeters (DSC)
- Thermocouples, RTDs, and infrared thermography
- Thermal conductivity meters
- Finite Element Analysis (FEA) and simulation tools
- AI platforms for real-time thermal image interpretation
Challenges & Solutions
- Challenge: Inaccurate readings due to emissivity variation
Solution: Use calibrated IR systems with material-specific settings - Challenge: Rapid temperature fluctuation in dynamic tests
Solution: Use high-speed sensors with real-time processing - Challenge: Limited thermal modeling accuracy
Solution: Integrate AI with multi-physics simulation models
Learning Objectives
- Perform precise, traceable thermal and thermophysical measurements
- Utilize simulation and AI tools for thermal behavior modeling
- Calibrate and deploy thermal sensors in diverse environments
- Optimize thermal testing for reliability and performance validation
9. Chemical and Gas Metrology
This session explores the precise measurement of chemical compositions and gas concentrations, essential for environmental monitoring, industrial safety, and medical diagnostics. The integration of AI enables real-time analysis and decision-making in complex sensing environments.
Key Subtopics
- Trace gas detection and quantification
- Calibration of chemical sensors and analysers
- Spectroscopy (FTIR, NDIR, UV-Vis) and mass spectrometry
- Volatile Organic Compound (VOC) testing
- Environmental metrology standards
- AI-based signal processing for gas chromatography
- Gas sensor networks and IoT integration
- Uncertainty analysis in chemical measurement
Applications
- Air quality monitoring and emissions compliance
- Process control in chemical manufacturing
- Breath-based medical diagnostics
- Hazard detection in industrial safety systems
Tools & Techniques
- Gas chromatographs and FTIR spectrometers
- Portable gas analyzers and PID detectors
- Reference gas standards and calibration stations
- AI software for spectral pattern classification
- Wireless sensor networks for distributed monitoring
Challenges & Solutions
- Challenge: Cross-sensitivity between similar compounds
Solution: Use multi-sensor fusion with AI-based signal discrimination - Challenge: Drift in low-cost chemical sensors
Solution: Implement automated recalibration using traceable references - Challenge: Real-time analysis under variable conditions
Solution: Integrate edge AI for adaptive sensing and correction
Learning Objectives
- Understand calibration protocols for chemical/gas sensors
- Apply AI to improve detection accuracy and analysis speed
- Design traceable sensing systems for regulated environments
- Assess uncertainty in complex chemical measurements
10. Metrology for Smart Manufacturing and Industry 4.0
This session focuses on test and measurement technologies that enable automation, predictive quality control, and digital integration in advanced manufacturing systems. As smart factories evolve, measurement systems must be intelligent, connected, and adaptive.
Key Subtopics
- In-line and real-time quality inspection systems
- Metrology integration with digital twins and MES
- Sensor fusion and edge analytics for shop floor monitoring
- Cyber-physical systems for process control
- OPC UA and industrial data exchange standards
- AI-driven defect detection and classification
- Robotics calibration and tool path verification
- Statistical process control (SPC) with uncertainty models
Applications
- Automotive and aerospace manufacturing lines
- Semiconductor fabrication and inspection
- Precision machining and CNC quality control
- Additive manufacturing and part validation
Tools & Techniques
- Machine vision systems and structured light scanners
- Laser interferometry and photogrammetry systems
- Industrial IoT (IIoT) platforms with metrology integration
- AI-powered analytics for yield and defect monitoring
- Closed-loop control systems with sensor feedback
Challenges & Solutions
- Challenge: Data silos between inspection and production systems
Solution: Use standardized interfaces (OPC UA, MQTT) for integration - Challenge: Latency in real-time defect detection
Solution: Deploy edge AI modules with local processing capability - Challenge: Inconsistent calibration across distributed sensors
Solution: Establish synchronized traceable calibration schedules
Learning Objectives
- Leverage metrology for digital manufacturing transformation
- Implement AI for automated inspection and quality control
- Understand how uncertainty impacts real-time decision-making
- Integrate measurement systems with smart factory workflows
11. AI, Data Science, and Uncertainty in Metrology
This session focuses on test and measurement technologies that enable automation, predictive quality control, and digital integration in advanced manufacturing systems. As smart factories evolve, measurement systems must be intelligent, connected, and adaptive.
Key Subtopics
- In-line and real-time quality inspection systems
- Metrology integration with digital twins and MES
- Sensor fusion and edge analytics for shop floor monitoring
- Cyber-physical systems for process control
- OPC UA and industrial data exchange standards
- AI-driven defect detection and classification
- Robotics calibration and tool path verification
- Statistical process control (SPC) with uncertainty models
Applications
- Automotive and aerospace manufacturing lines
- Semiconductor fabrication and inspection
- Precision machining and CNC quality control
- Additive manufacturing and part validation
Tools & Techniques
- Machine vision systems and structured light scanners
- Laser interferometry and photogrammetry systems
- Industrial IoT (IIoT) platforms with metrology integration
- AI-powered analytics for yield and defect monitoring
- Closed-loop control systems with sensor feedback
Challenges & Solutions
- Challenge: Data silos between inspection and production systems
Solution: Use standardized interfaces (OPC UA, MQTT) for integration - Challenge: Latency in real-time defect detection
Solution: Deploy edge AI modules with local processing capability - Challenge: Inconsistent calibration across distributed sensors
Solution: Establish synchronized traceable calibration schedules
Learning Objectives
- Leverage metrology for digital manufacturing transformation
- Implement AI for automated inspection and quality control
- Understand how uncertainty impacts real-time decision-making
- Integrate measurement systems with smart factory workflows
12. Time, Frequency, and Synchronization Metrology
This session focuses on the measurement and calibration of time and frequency—a foundation for navigation, communications, and scientific systems. Precision synchronization enables ultra-low-latency networks, reliable control systems, and secure time-stamping.
Key Subtopics
- Frequency stability and jitter analysis
- Time transfer techniques (NTP, PTP, GNSS)
- Clock synchronization for distributed systems
- Calibration of oscillators, rubidium, and atomic clocks
- Time interval counters and phase comparators
- AI for anomaly detection in time series drift
- Time traceability and secure timestamping systems
- Quantum timekeeping and optical clocks
Applications
- 5G/6G telecom and base station synchronization
- Financial transaction time-stamping
- Industrial control systems and robotics
- Scientific instrumentation and astronomical observatories
Tools & Techniques
- High-precision time interval analyzers
- GNSS-disciplined oscillators (GPSDO)
- IEEE 1588 Precision Time Protocol (PTP) testing tools
- Network time servers and synchronization monitoring software
- Atomic reference clocks and disciplined frequency counters
Challenges & Solutions
- Challenge: Network-induced latency in time transfer
Solution: Use hardware timestamping and boundary clocks (PTP) - Challenge: Clock drift in remote or mobile systems
Solution: Employ GNSS-corrected holdover oscillators - Challenge: Measuring ultra-short intervals at high resolution
Solution: Use time-stretching and averaging techniques with calibration
Learning Objectives
- Master time synchronization technologies for mission-critical systems
- Calibrate and analyze oscillator stability and accuracy
- Implement PTP and GNSS solutions in distributed networks
- Ensure traceability in time-sensitive applications
13. Environmental and Climate Measurement Systems
This session addresses the growing demand for accurate, traceable, and automated environmental measurements to support climate research, regulatory compliance, and sustainability initiatives. Emphasis is placed on long-term monitoring, sensor calibration, and AI-based data validation.
Key Subtopics
- Air quality and greenhouse gas measurement protocols
- Sensor networks for environmental monitoring
- Satellite and remote sensing validation
- AI-based anomaly detection in climate datasets
- Traceability in meteorological measurements
- Standardization of climate observation networks
- IoT integration for environmental field instruments
- Uncertainty modeling in large-scale measurements
Applications
- National climate monitoring and forecasting centers
- Industrial emissions compliance
- Environmental impact assessments
- Smart cities and infrastructure planning
Tools & Techniques
- FTIR gas analyzers and particulate sensors
- LiDAR, RADAR, and hyperspectral imaging
- Environmental data loggers and telemetry systems
- AI tools for geospatial data analysis and forecasting
- Calibration stations and reference field labs
Challenges & Solutions
- Challenge: Sensor drift in long-term deployments
Solution: Periodic calibration with field-deployable standards - Challenge: Interpreting large, noisy environmental datasets
Solution: Use of AI and data fusion for pattern recognition - Challenge: Low comparability across sensing platforms
Solution: Adoption of international environmental measurement protocols
Learning Objectives
- Design traceable environmental sensing systems
- Apply AI to enhance climate data reliability
- Understand regulatory requirements for emissions testing
- Integrate remote and in-situ data sources for modeling
14. Biomedical and Life Science Measurement Innovations
This session explores R&D in precision measurements that support medical diagnostics, biological research, and healthcare device calibration. Innovations in biosensing and AI-based data analysis are transforming clinical decision-making and regulatory validation.
Key Subtopics
- Non-invasive biosensor calibration and testing
- Biopotential and physiological signal measurement
- Medical device compliance and metrological traceability
- AI-assisted signal processing for diagnostics
- Optical and molecular biosensing
- Laboratory automation and traceable assays
- Wearable medical technologies testing
- Human factor validation and usability metrics
Applications
- Clinical diagnostics and point-of-care testing
- Biomedical R&D and device prototyping
- Regulatory testing for FDA/CE compliance
- Remote patient monitoring platforms
Tools & Techniques
- ECG/EEG/EMG calibration platforms
- Spectrophotometers and biosignal amplifiers
- AI models for diagnostic pattern recognition
- ISO/IEC 17025-based medical test protocols
- Lab-on-chip and microfluidic measurement systems
Challenges & Solutions
- Challenge: Inconsistent results across different biosensing platforms
Solution: Implement standardized calibration protocols and traceable references - Challenge: Data overload in multi-signal diagnostics
Solution: Apply AI filtering and feature extraction techniques - Challenge: Measurement artifacts from user variability
Solution: Integrate human factor engineering in measurement desig
Learning Objectives
- Understand regulatory testing workflows for medical systems
- Apply AI to process biomedical test data
- Calibrate biosensors for high reliability and repeatability
- Validate diagnostic systems using metrological principles
15. Materials Characterization and Non-Destructive Testing
This session highlights advanced methods for characterizing material properties without damaging components, crucial for aerospace, automotive, civil, and additive manufacturing industries. It covers both traditional NDT techniques and AI-enhanced inspection approaches.
Key Subtopics
- Ultrasonic testing (UT) and phased array UT
- Radiographic testing (X-ray, CT)
- Acoustic emission and thermography
- AI-assisted defect detection and classification
- Materials microstructure and hardness mapping
- Magnetic particle and eddy current inspection
- In-line NDT for additive manufacturing
- Digital twin validation using NDT feedback
Applications
- Aerospace and automotive parts inspection
- Structural health monitoring of bridges and buildings
- Quality assurance in metal and composite manufacturing
- Real-time inspection in 3D printing processes
Tools & Techniques
- Digital radiography and portable ultrasonic testers
- AI/ML algorithms for flaw identification
- Eddy current probes and magnetic field sensors
- Non-contact thermal cameras for material profiling
- Simulation tools for NDT signal modeling
Challenges & Solutions
- Challenge: High false-positive rate in defect detection
Solution: Integrate AI-driven image recognition for improved accuracy - Challenge: Limited accessibility in complex geometries
Solution: Use flexible or robotic NDT systems - Challenge: Variability in operator-based assessments
Solution: Automate reporting with standardized image analysis tools
Learning Objectives
- Apply advanced NDT tools for structural and material integrity
- Integrate AI into defect detection and quantification workflows
- Calibrate and validate measurement systems for NDT compliance
- Evaluate new materials using traceable characterization methods
16. Electromagnetic Compatibility (EMC) and High-Voltage Testing
This session addresses EMC testing and high-voltage test practices that ensure safe, interference-free operation of electrical and electronic systems. With the rise of EVs, 5G, and power electronics, advanced metrology is critical to meet stringent regulatory and performance standards.
Key Subtopics
- EMC emission and immunity testing protocols
- Radiated and conducted emissions measurement
- Surge, ESD, and transient immunity evaluation
- High-voltage insulation and dielectric testing
- Grounding and shielding effectiveness measurement
- Pre-compliance testing in design workflows
- Test chamber calibration and traceability
- AI-based signal classification for EMC diagnostics
Applications
- Electric vehicles and battery systems compliance
- Power grid and HV transmission infrastructure
- Consumer electronics and embedded systems
- RF/microwave devices in telecom and defense
Tools & Techniques
- EMI receivers and spectrum analyzers
- GTEM cells, anechoic and reverberation chambers
- Surge and ESD generators
- High-voltage probes and insulation testers
- AI tools for noise identification and signature tracking
Challenges & Solutions
- Challenge: Difficulty predicting EMC issues during design
Solution: Implement pre-compliance simulations with real-time test feedback - Challenge: Variability in test results due to setup configuration
Solution: Automate test bench configuration and repeatability controls - Challenge: Identifying root causes in multi-source interference
Solution: Use AI-based classification of emission signatures
Learning Objectives
- Perform EMC and HV tests in accordance with global standards
- Predict and mitigate EMI issues early in product design
- Utilize AI to streamline interference diagnostics
- Ensure traceability and safety in high-voltage test setups
17. Calibration Science, Infrastructure, and Global Comparisons
This session examines the foundational role of calibration science in ensuring metrological traceability, consistency, and interoperability across industries and national borders. It explores the infrastructure supporting global comparisons and standardization of measurement systems, critical to fair trade, innovation, and regulatory alignment.
Key Subtopics
- Primary and secondary calibration standards
- Metrological traceability chains
- International measurement comparisons (CIPM MRA, BIPM KCDB)
- Uncertainty budgets and error propagation
- Digital calibration certificates (DCCs)
- Time and frequency dissemination for traceability
- Calibration of AI-based sensors and edge devices
- Metrology infrastructure design and laboratory accreditation
- ISO/IEC 17025 and related quality management systems
Applications
- Aerospace and defense manufacturing certification
- Cross-border industrial trade and regulatory audits
- High-precision instrumentation calibration (optical, RF, thermal)
- Research laboratories and standards institutes
Tools & Techniques
- Calibration benches and metrology-grade instruments
- Automated calibration management systems
- Reference materials and artifact standards
- Environmental chambers for condition-specific calibration
- Uncertainty evaluation software and modeling tools
Challenges & Solutions
- Challenge: Lack of harmonization in global calibration methods
Solution: Participate in international comparisons and adopt CIPM MRA standards - Challenge: Limited traceability in emerging sensor types
Solution: Develop calibration protocols for AI-integrated and MEMS-based systems - Challenge: Manual and error-prone calibration recordkeeping
Solution: Deploy digital calibration certificates with blockchain integration
Learning Objectives
- Understand traceability requirements and uncertainty modeling
- Design calibration systems aligned with international standards
- Use digital tools to manage calibration workflows
- Evaluate calibration infrastructure for compliance and scalability
18. Legal, Ethical, and Societal Aspects of Metrology
This session addresses the broader implications of measurement systems in legal, ethical, and societal contexts. It emphasizes the critical need for transparency, accountability, and fairness in how measurements are defined, applied, and interpreted—particularly as AI and data systems influence public and industrial decision-making.
Key Subtopics
- Legal metrology frameworks and global compliance bodies (OIML, WELMEC)
- Metrological ethics and societal trust
- Measurements in legal contracts, forensics, and policy decisions
- Fairness and bias in algorithmic measurements
- Data privacy in AI-driven measurement systems
- Responsible innovation in smart metrology
- Citizen metrology and public engagement
- Role of metrology in sustainability and SDGs
Applications
- National measurement institutes and government agencies
- Legal and compliance teams in regulated industries
- AI and digital health systems validation
- Utility and infrastructure billing accuracy
Tools & Techniques
- Legal metrology test kits and verification procedures
- Compliance software for OIML-certified systems
- AI bias auditing tools for measurement algorithms
- Smart meters and tamper-detection systems
- Digital rights management in data-centric metrology
Challenges & Solutions
- Challenge: Unclear legal frameworks for AI-based measurements
Solution: Align AI applications with evolving legal metrology norms - Challenge: Ethical concerns in algorithmic decision-making
Solution: Conduct transparency audits and explainability assessments - Challenge: Public distrust in automated measurement outcomes
Solution: Implement traceable and auditable metrology systems with public oversight
Learning Objectives
- Navigate the legal frameworks governing measurements in regulated sectors
- Address ethical challenges in digital and algorithmic measurement systems
- Apply traceability principles in public-facing measurement technologies
- Build societal trust through responsible, transparent metrology practices
Session 1: Frontiers in Quantum Metrology and Fundamental Constants
- Redefinition and realization of SI base units
- Quantum Hall resistance and Josephson voltage standards
- Optical lattice clocks and time-frequency transfer
- Quantum interferometry and entanglement-based measurements
- Single-electron and photon-counting instrumentation
- Fundamental constants: precision determination and stability
Session 2: Ultra-Precision and Nanometrology Techniques
- Scanning probe microscopy for dimensional metrology
- Sub-nanometer displacement and position sensing
- Atomic-scale surface roughness measurements
- Interferometric and capacitive position metrology
- Nanoparticle characterization and size distribution
- Traceable measurements at the nanoscale
Session 3: High-Frequency, mmWave, and THz Measurements
- Calibration and characterization of mmWave and THz systems
- Nonlinear and active device modeling and measurement
- Dielectric characterization at mmWave and THz frequencies
- 5G/6G and high-bandwidth spectrum analysis
- Radiometry and THz imaging systems
- On-wafer and OTA measurement challenges
Session 4: Optical and Photonic Metrology
- Ultra-stable lasers and frequency comb calibration
- Free-space and fiber-optic interferometry
- Photonic integrated circuit test platforms
- Characterization of light sources and detectors
- Spectroradiometric and colorimetric measurements
- Coherence, polarization, and scattering analysis
Session 5: RF and Microwave Metrology
- Vector network analyzer (VNA) traceability and error models
- Noise figure and phase noise measurement techniques
- Power sensors and standards at microwave frequencies
- Calibration artifacts and load-pull measurements
- Cross-spectrum and correlation-based techniques
- Passive and active microwave component characterization
Session 6: Electrical and Electronic Metrology
- Current, voltage, and resistance calibration techniques
- Digital multimeter verification and standard resistors
- Electromagnetic interference and compatibility metrics
- High-impedance and low-leakage measurement systems
- Switching artifacts and parasitic suppression in electronics
- Verification of electronic reference instruments
Session 7: Mechanical Metrology and Structural Testing
- Dimensional metrology with coordinate measuring machines (CMMs)
- Angular and linear displacement calibration
- Surface texture and form deviation evaluation
- Vibration, modal, and impact response testing
- Residual stress and mechanical fatigue metrology
- Robotic-assisted mechanical testing systems
Session 8: Thermal and Thermophysical Measurements
- Precision thermometry and fixed-point calibration
- Thermal conductivity and diffusivity testing
- Temperature mapping in micro/nano devices
- Cryogenic temperature metrology
- Heat flux and thermal imaging techniques
- Blackbody and radiation thermometry development
Session 9: Chemical and Gas Metrology
- Mass spectrometry and isotope ratio validation
- Gas standards and primary mixture generation
- Infrared and Raman spectroscopy for trace gas detection
- VOC and greenhouse gas metrology
- Calibration of chemical sensors and analyzers
- Reference materials and chemical uncertainty analysis
Session 10: Metrology for Smart Manufacturing and Industry 4.0
- Real-time process control with in-situ metrology
- Sensor fusion and AI-assisted decision making
- Closed-loop feedback systems for manufacturing metrology
- Digital twins and virtual instrumentation platforms
- Robotic vision-based metrology for additive manufacturing
- Standards for interoperable metrology in smart factories
Session 11: AI, Data Science, and Uncertainty in Metrology
- Bayesian and machine learning approaches for uncertainty quantification
- AI-enhanced test optimization and fault detection
- Neural networks for signal denoising and prediction
- Metrological traceability of AI-driven measurement systems
- Handling of outliers and anomalous data
- Standards and documentation of data integrity
Session 12: Time, Frequency, and Synchronization Metrology
- GNSS-based time transfer and integrity testing
- Ultra-low-jitter clock distribution systems
- Two-way satellite time and frequency transfer (TWSTFT)
- Frequency stability metrics (Allan, Hadamard deviations)
- UTC realization and national timekeeping
- Time synchronization over networks (PTP, NTP, White Rabbit)
Session 13: Environmental and Climate Measurement Systems
- Air quality and particulate monitoring standards
- Climate variable instrumentation: temperature, pressure, humidity
- Calibration of weather and hydrological sensors
- Metrology for oceanographic and atmospheric parameters
- Remote sensing validation (LIDAR, satellite)
- Traceable CO₂ and methane detection systems
Session 14: Biomedical and Life Science Measurement Innovations
- Quantitative bio-imaging and fluorescence calibration
- Biophysical property measurement of tissues and cells
- Physiological monitoring system accuracy (ECG, SpO₂, BP)
- Calibration of diagnostic and therapeutic devices
- Biosensor calibration and stability
- Measurement standards in genomic and proteomic analysis
Session 15: Materials Characterization and Non-Destructive Testing
- Microstructure quantification and image analysis
- Spectroscopic techniques for material identification
- Fatigue, creep, and fracture mechanics testing
- Non-destructive testing (ultrasound, X-ray, eddy current)
- Phase transformation and residual stress monitoring
- Nano-indentation and tribology for thin films
Session 16: Electromagnetic Compatibility (EMC) and High-Voltage Testing
- Radiated and conducted emissions testing
- Shielding effectiveness and field strength measurements
- Lightning impulse and high-voltage dielectric tests
- Electric/magnetic field immunity testing
- High-voltage test equipment and calibration
- EMC modeling and compliance with CISPR/IEC standards
Session 17: Calibration Science, Infrastructure, and Global Comparisons
- Development of national and international primary standards
- Automation in calibration laboratories
- Remote and robotic calibration methods
- Measurement intercomparisons and key comparisons (CIPM-MRA)
- Laboratory accreditation and quality systems (ISO/IEC 17025)
- Emerging traceability chains for novel quantities
Session 18: Legal, Ethical, and Societal Aspects of Metrology
- Measurement and traceability in legal metrology
- Standards harmonization and regulation impact
- Ethical frameworks for data and measurement reliability
- Socio-economic impact assessments of metrology R&D
- Measurement education and workforce development
- Role of metrology in public safety and policymaking
The R & D for Test & Measurement session series at TekSummit is a must-attend for engineering professionals, metrologists, product developers, and research leaders seeking to stay ahead of the curve in measurement science. Whether you’re advancing quantum-based systems, building nanotechnology platforms, developing RF circuits, or optimizing optical networks, these sessions offer valuable insights, technical rigor, and forward-looking practices.
Reach out to us at Speakers-TekSummit@TheGAOGroup.com or fill out Contact Us to explore speaking, participation, or sponsorship opportunities.